The New Algorithm for the Determination of the Williams Asymptotic Expansion Coefficients for Notched Semidiscs Using the Photoelasticity Method and Finite Element Method

Abstract

The study proposes the algorithm for the determination of the coefficients of the Williams series expansion in notched semidisks with different angles of the notch. The algorithm is based on the experimental procedure of the photoelasticity method and the finite element analysis. The large series of experiments for semidiscs was performed. Digital photoelasticity method is used to analyse experimentally the complete Williams series expansion of the stress and displacement fields in the vicinity of the crack tip in isotropic linear elastic plates under Mixed Mode loading. The distribution of the isochromatic fridge patterns is employed for obtaining the stress field near the crack tip by the use of the complete Williams asymptotic expansion for various classes of the experimental specimens (plates with two collinear cracks under tensile loading and under mixed mode loading conditions). The higher order terms of the Williams series expansion are taken into account and the coefficients of the higher order terms are experimentally obtained. The stress field equation of Williams up to fifty terms in each in mode I and mode II has been considered. The comparison of the experimental results and the calculations performed with finite element analysis has shown the importance and significant advantages of photoelastic observations for the multi-parameter description of the stress field in the neighborhood of the crack tip.