Отрывок: 4 and Eq. 8 as given by Eq. 9: 0 0 . .= . 2 2 L Lh f d f d      (9) Analysis and reduction of error sources for PSP There are many causes of phase error, the main causes are classified as: intensity noise, non-linearity error, detector saturation. 1. intensity noise. Sources of intense noise include unstable ambient lighting, projector lighting noise, camera/projector flicker, camera noise, and quantization. A captured image with stripes suffers from intensity noi...
Название : 3D measurement using fringe projection profilometry
Авторы/Редакторы : Alkhatib, M.N.
Shmelev, Y.D.
Tyshova, O.A.
Sinilshchikov, I.V.
Bobkov, A.V.
Ключевые слова : fringe projection profilometry FPP
structured light
Дата публикации : Ноя-2023
Издательство : Самарский национальный исследовательский университет
Библиографическое описание : Alkhatib MN, Shmelev YD, Tyshova OA, Sinilshchikov IV, Bobkov AV. 3D measurement using fringe projection profilometry. Computer Optics 2023; 47(6): 913-919. DOI: 10.18287/2412-6179-CO-1297.
Серия/номер : 47;6
Аннотация : This work is devoted to measuring the depth of the 3D object using the structured light method, in particular, phase shift profilometry. Theoretical studies on the methods of three-dimensional measurement systems and fringe projection profilometry are presented. The phase shift profilometry method with an improved calculation of the frequency of sinusoidal patterns is applied. In practical implementation in the environment (20 cm × 30 cm), the algorithm is tested on a stepped object consisting of eight steps with a difference of 150 mm between two successive steps. In this case, the achievable error for measuring such an object is 20 mm. Our method has great potential in industrial applications where the measurement of the smoothing of the surface of the object is needed to find the defect in the surface with high accuracy without contacting the object.
URI (Унифицированный идентификатор ресурса) : https://dx.doi.org/10.18287/2412-6179-CO-1297
http://repo.ssau.ru/handle/Zhurnal-Komputernaya-optika/3D-measurement-using-fringe-projection-profilometry-109478
Другие идентификаторы : Dspace\SGAU\20240518\109478
Располагается в коллекциях: Журнал "Компьютерная оптика"

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