Отрывок: 4 and Eq. 8 as given by Eq. 9: 0 0 . .= . 2 2 L Lh f d f d      (9) Analysis and reduction of error sources for PSP There are many causes of phase error, the main causes are classified as: intensity noise, non-linearity error, detector saturation. 1. intensity noise. Sources of intense noise include unstable ambient lighting, projector lighting noise, camera/projector flicker, camera noise, and quantization. A captured image with stripes suffers from intensity noi...
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dc.contributor.authorAlkhatib, M.N.-
dc.contributor.authorShmelev, Y.D.-
dc.contributor.authorTyshova, O.A.-
dc.contributor.authorSinilshchikov, I.V.-
dc.contributor.authorBobkov, A.V.-
dc.date.accessioned2024-06-18 10:46:56-
dc.date.available2024-06-18 10:46:56-
dc.date.issued2023-11-
dc.identifierDspace\SGAU\20240518\109478ru
dc.identifier.citationAlkhatib MN, Shmelev YD, Tyshova OA, Sinilshchikov IV, Bobkov AV. 3D measurement using fringe projection profilometry. Computer Optics 2023; 47(6): 913-919. DOI: 10.18287/2412-6179-CO-1297.ru
dc.identifier.urihttps://dx.doi.org/10.18287/2412-6179-CO-1297-
dc.identifier.urihttp://repo.ssau.ru/handle/Zhurnal-Komputernaya-optika/3D-measurement-using-fringe-projection-profilometry-109478-
dc.description.abstractThis work is devoted to measuring the depth of the 3D object using the structured light method, in particular, phase shift profilometry. Theoretical studies on the methods of three-dimensional measurement systems and fringe projection profilometry are presented. The phase shift profilometry method with an improved calculation of the frequency of sinusoidal patterns is applied. In practical implementation in the environment (20 cm × 30 cm), the algorithm is tested on a stepped object consisting of eight steps with a difference of 150 mm between two successive steps. In this case, the achievable error for measuring such an object is 20 mm. Our method has great potential in industrial applications where the measurement of the smoothing of the surface of the object is needed to find the defect in the surface with high accuracy without contacting the object.ru
dc.description.sponsorshipThis work was supported by the Raitec LLC company of Moscow province of Russia in the research and production department.ru
dc.language.isoenru
dc.publisherСамарский национальный исследовательский университетru
dc.relation.ispartofseries47;6-
dc.subjectfringe projection profilometry FPPru
dc.subjectstructured lightru
dc.title3D measurement using fringe projection profilometryru
dc.typeArticleru
dc.textpart4 and Eq. 8 as given by Eq. 9: 0 0 . .= . 2 2 L Lh f d f d      (9) Analysis and reduction of error sources for PSP There are many causes of phase error, the main causes are classified as: intensity noise, non-linearity error, detector saturation. 1. intensity noise. Sources of intense noise include unstable ambient lighting, projector lighting noise, camera/projector flicker, camera noise, and quantization. A captured image with stripes suffers from intensity noi...-
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