Отрывок: Fig. 3. Schematic representation and the principle of thickness measurement for transparent object: (a) rotational sample holder SH with the cover slip S of thickness d = 250 μm; (b) principle of metering, where two measurements were token: first one “1”, when slip was placed strictly horizontally and the second one “2” with tiny inclination ( = 05) controlled with sample holder SH; (c) optical config...
Название : Determination of microrelief of the sample by singular beams superposition
Авторы/Редакторы : Sokolenko, B.
Shostka, N.
Karakchieva, O.
Volyar, A.V.
Poletayev, D.
Ключевые слова : optical vortex
phase
optical microscopy
singular beams
surface relief detection
Дата публикации : Окт-2019
Издательство : Новая техника
Библиографическое описание : Sokolenko, B. Determination of microrelief of the sample by singular beams superposition / B. Sokolenko, N. Shostka, O. Karakchieva, A.V. Volyar, D. Poletaev // Computer Optics. – 2019. – Vol. 43(5). – P. 741-746. – DOI: 10.18287/2412-6179-2019-43-5-741-746
Серия/номер : 43;5
Аннотация : In present paper we propose easy way to implement method of interfering vortices with opposite topological charge for the real time determination of the thickness and information about the surface of studied samples with the resolution up to 7 nanometers. The determination of the characteristics of the medial cross-section of submicron-objects becomes possible due to phase sensitivity of interfering singular beams to the slightest changes in the optical path difference between them. The dependence of rotational angle of resulting interference pattern in case of different sample thickness for two singular beams superposition is considered in detail.
URI (Унифицированный идентификатор ресурса) : https://dx.doi.org/10.18287/2412-6179-2019-43-5-741-746
http://repo.ssau.ru/handle/Zhurnal-Komputernaya-optika/Determination-of-microrelief-of-the-sample-by-singular-beams-superposition-80232
Другие идентификаторы : Dspace\SGAU\20191116\80232
Располагается в коллекциях: Журнал "Компьютерная оптика"

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